Design for testing

Results: 872



#Item
231Electronics / Boundary scan / In-circuit test / Design for testing / Joint Test Action Group / Test engineer / Scan chain / Fault coverage / Test / Electronics manufacturing / Electronic engineering / Manufacturing

IKOR Group www.xjtag.com HOME APPLIANCES AUTOMOTIVE

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Source URL: www.xjtag.com

Language: English - Date: 2010-04-08 06:42:01
232Statistical inference / Statistical tests / PASS Sample Size Software / Sample size determination / NCSS / Statistical hypothesis testing / Statistical power / Null hypothesis / Z-test / Statistics / Hypothesis testing / Design of experiments

Superiority by a Margin Tests for Two Proportions in a Cluster-Randomized Design

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Source URL: ncss.wpengine.netdna-cdn.com

Language: English - Date: 2014-02-19 16:17:39
233Integrated circuits / Electronic design / Software testing / Automatic test pattern generation / Scan chain / Code coverage / Automatic test equipment / Fault coverage / Electronic engineering / Electronics / Electronic design automation

Datasheet DFTMAX Ultra Compression for Highest Test Quality and Lowest Test Cost Overview

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:25
234Technology / Joint Test Action Group / Boundary scan / System on a chip / Scan chain / Design for testing / Electronics manufacturing / Electronic engineering / Electronics

Imagination develops SoCs faster using XJTAG boundary scan

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Source URL: www.xjtag.com

Language: English - Date: 2009-09-07 08:16:06
235Integrated circuits / Electronic design / Application-specific integrated circuit / Integrated circuit design / System on a chip / Signal integrity / Integrated circuit / Design for testing / Electronic circuit / Electronic engineering / Electronics / Design

Mixed Signal-ASICs: From design to good integrated circuits Workshop on Affordable Design and Production of Mixed-Signal ASICs for Small and Medium Enterprises (SMEs)

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Source URL: groupe-serma-technologies.com

Language: English - Date: 2011-04-28 12:11:45
236Technology / Joint Test Action Group / Boundary scan / System on a chip / Scan chain / Design for testing / Electronics manufacturing / Electronic engineering / Electronics

www.xjtag.com Imagination Technologies Mark Dunn, VP Engineering with Simon Payne, CEO XJTAG

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Source URL: www.xjtag.com

Language: English - Date: 2009-09-07 08:16:06
237Electronics / Joint Test Action Group / Boundary scan / Design for testing / Field-programmable gate array / Booting / Atmel AVR / In-circuit test / Electronics manufacturing / Manufacturing / Electronic engineering

www.xjtag.com XJDeveloper Key Benefits Overview

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Source URL: www.xjtag.com

Language: English - Date: 2014-03-27 05:49:49
238Scientific method / Evaluation methods / Clinical research / Hypothesis testing / Medical statistics / Clinical trial / Confounding / Effect size / Cohort study / Statistics / Science / Design of experiments

Statistics Guide for Research Grant Applicants Appendix 1 Statistics Guide for Research Grant Applicants Checklist Tick [4] those that apply

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Source URL: www-users.york.ac.uk

Language: English - Date: 2003-09-29 06:14:10
239Biostatistics / Hypothesis testing / Medical statistics / Receiver operating characteristic / Statistical power / Sensitivity and specificity / Case-control study / Tuberculosis treatment / Experiment / Statistics / Epidemiology / Design of experiments

Microsoft PowerPoint - OMOP Symposium for Japan 19oct2013.pptx

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Source URL: www.jpma.or.jp

Language: English - Date: 2013-11-01 00:26:09
240Environmental chemistry / Air pollution in the United States / Air pollution / Design of experiments / Ozone / Clean Air Act / Statistical hypothesis testing / National Ambient Air Quality Standards / Criteria air contaminants / Statistics / Environment / Hypothesis testing

Statistical Hypothesis Testing Formulations for U.S. Environmental Regulatory Standards for Ozone Mary Lou Thompson Lawrence H. Cox

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Source URL: www.nrcse.washington.edu

Language: English - Date: 2001-08-14 12:46:49
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